Standard processing of samples for three-dimensional investigation of cellular and sub-cellular morphologies using Focussed Ion Beam – Scanning Electron Microscopy (FIB-SEM). Project will cover processing and embedding of fixed samples in plastic, trimming and mounting the block on a stub ready for ion milling and heavy metal coating the block to increase conductivity.

FIB-SEM Sample Preparation Request
Briefly describe the sample you want to image, and what you are hoping to visualize. Please include specific regions that you are targeting.

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