Transmission Electron Microscopy
JEOL JEM-1400 120kV TEM
The JEOL JEM-1400Plus is a 120kV Transmission Electron Microscope (TEM) that features 0.38nm point resolution and is configured for imaging at either 80kV or 120kV. It has a 5-axis high-precision Piezo motorized stage suitable for large-area montages and is equipped with an AMT XR111 high-speed 4k x 2k pixel phosphor-scintillated 12-bit CCD camera, which features vibration-free Peltier cooling and 12µm pixel sizing.
Scanning Electron / Ion Microscopy
Zeiss Merlin FE-SEM
The Zeiss Merlin FE-SEM is a high-resolution Scanning Electron Microscope (SEM) for the analytical imaging of whole mount or thin section samples. Equipped with a GEMINI II column, this SEM has superb low kV performance. The voltage can be adjusted from 0.02-30 kV (10 pA to 40 nA probe current) with 3.0 nm resolution at 0.2 kV, 1.8 nm at 1 kV, and 0.9nm at 15kV. In order to accommodate a large array of sample types, the system is equipped with different detectors.
System configuration:
- Everhart-Thornley Secondary Detector
- In-lens Secondary Detector
- 4-quadrant Solid State Backscatter Detector
- In-lens Energy Selective Backscatter Detector
- Solid State STEM Detector
In addition to the included imaging software, the Merlin is also equipped with the ATLAS 5.0 scan engine which boasts gigapixel imaging capabilities (50k x 40K pixels) for large-area imaging projects. The ATLAS software comes with the following unique imaging modality:
- Array Tomography – This module allows the automated imaging of biological serial sections for 3D analysis of large volumes