Transmission Electron Microscopy 

JEOL JEM-1400 120kV TEM

The JEOL JEM-1400Plus is a 120kV Transmission Electron Microscope (TEM) that features 0.38nm point resolution and is configured for imaging at either 80kV or 120kV. It has a 5-axis high-precision Piezo motorized stage suitable for large-area montages and is equipped with an AMT XR111 high-speed 4k x 2k pixel phosphor-scintillated 12-bit CCD camera, which features vibration-free Peltier cooling and 12µm pixel sizing.


Scanning Electron / Ion Microscopy 

Zeiss Merlin FE-SEM

The Zeiss Merlin FE-SEM is a high-resolution Scanning Electron Microscope (SEM) for the analytical imaging of whole mount or thin section samples. Equipped with a GEMINI II column, this SEM has superb low kV performance. The voltage can be adjusted from 0.02-30 kV (10 pA to 40 nA probe current) with 3.0 nm resolution at 0.2 kV, 1.8 nm at 1 kV, and 0.9nm at 15kV. In order to accommodate a large array of sample types, the system is equipped with different detectors.

System configuration:

  • Everhart-Thornley Secondary Detector
  • In-lens Secondary Detector
  • 4-quadrant Solid State Backscatter Detector
  • In-lens Energy Selective Backscatter Detector
  • Solid State STEM Detector

In addition to the included imaging software, the Merlin is also equipped with the ATLAS 5.0 scan engine which boasts gigapixel imaging capabilities (50k x 40K pixels) for large-area imaging projects. The ATLAS software comes with the following unique imaging modality:

  • Array Tomography – This module allows the automated imaging of biological serial sections for 3D analysis of large volumes

Zeiss Crossbeam 540 FIB-SEM

The Zeiss Crossbeam 540 is a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for the analytical imaging of whole samples and the 3D nanotomography of embedded samples. Equipped with a GEMINI II column, this SEM has superb low kV performance. The voltage can be adjusted from 0.02-30 kV (10 pA to 40 nA probe current) with 3.0 nm resolution at 0.2 kV, 1.8 nm at 1 kV, and 0.9nm at 15kV. In order to accommodate a large array of sample types, the system is equipped with different detectors.

System configuration:

  • Everhart-Thornley Secondary Detector
  • In-lens Secondary Detector
  • 4-quadrant Solid State Backscatter Detector
  • In-lens Energy Selective Backscatter Detector
  • Solid State STEM Detector

The Crossbeam 540 is equipped with a Capella Ga-Liquid Metal Ion Source (Ga-LMIS) column that is capable of 3nm milling resolution at 30kV. The column can be set to 0.5-30kV (1pA to 100nA probe current). When coupled with the unique nature of the GEMINI II column, imaging can be performed using only the SEM column, only the FIB column, or simultaneous SEM imaging/FIB imaging or milling for easy monitoring of routines. For masking and charge compensation purposes, the instrument is equipped with two Orsay gas injection systems with both Pt and C precursor gasses.

In addition to the included imaging software, the Crossbeam 540 is also equipped with the ATLAS 5.0 scan engine which boasts gigapixel imaging capabilities (50k x 40k pixels) for large-area imaging projects. In addition, the software comes with two unique imaging modules:

  • Array Tomography – This module allows the automated imaging of biological serial sections for 3D analysis of large volumes.
  • 3D Tomography – This module offers an automated solution with unique, high-speed proprietary workflows for the automatic acquisition of FIB tomography datasets.